Source-to-Drain Tunneling Analysis in FDSOI, DGSOI, and FinFET Devices by Means of Multi subband Ensemble Monte Carlo

Artículo original

Año: 2018

Medina-Bailon, C; Padilla, JL; Sampedro, C; Godoy, A; Donetti, L; Gamiz, F

Título: IEEE TRANSACTIONS ON ELECTRON DEVICES

• Q2