Performance and reliability in back-gated CVD-grown MoS2 devices
FI: 1,901
Tipo: Article
Artículo original
Año: 2021
Autores
Marquez, C; Salazar, N; Gity, F; Galdon, JC; Navarro, C; Duffy, R; Hurley, P; Gamiz, F
Revista
Título: SOLID-STATE ELECTRONICS
Cuartil
- Q3