Electrical characterization of Random Telegraph Noise in Fully-Depleted Silicon-On-Insulator MOSFETs under extended temperature range and back-bias operation
FI: 1,345
Tipo: Article
Colaboración
Año: 2016
Autores
Marquez, C; Rodriguez, N; Gamiz, F; Ruiz, R; Ohata, A
Revista
Título: SOLID-STATE ELECTRONICS
Cuartil
- Q2