Electrical Characterization of Random Telegraph Noise in Back-Biased Ultrathin Silicon-On-Insulator MOSFETs

Tipo: Proceedings Paper

Inicio · TEC04-Nanoelectrónica

Colaboración

Año: 2016

Autores

Marquez, C; Rodriguez, N; Gamiz, F; Ohata, A

Revista

Título: 2016 JOINT INTERNATIONAL EUROSOI WORKSHOP AND INTERNATIONAL CONFERENCE ON ULTIMATE INTEGRATION ON SILICON (EUROSOI-ULIS 2016)