Analysis of conductive filament density in resistive random access memories: a 3D kinetic Monte Carlo approach

Colaboración

Año: 2018

Aldana, S; Garcia-Fernandez, P; Romero-Zaliz, R; Jimenez-Molinos, F; Gomez-Campos, F; Roldan, JB

Título: JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B

• Q3