Experimental analysis of variability in WS2-based devices for hardware security

Colaboración

Año: 2023

Vatalaro, M; Neill, H; Gity, F; Magnone, P; Maccaronio, V; Márquez, C; Galdon, JC; Gamiz, F; Crupi, F; Hurley, P; De Rose, R

Título: SOLID-STATE ELECTRONICS

• Q3